Nano Measurer 1.2

Lightweight image analysis tool for quantifying features in nanoscale microscopy images
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Latest version:
1.2.0.5 See all
Developer:
Department of Chemitry, Fudan University
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Nano Measurer is a lightweight image analysis tool for quantifying features in nanoscale microscopy images. Designed for rapid, practical measurements, it helps researchers analyze TEM, SEM, and AFM micrographs by converting pixels to real-world units and extracting meaningful statistics for reports and publications.

Key capabilities:

  • Calibrate measurements using a scale bar or known pixel-to-length ratio
  • Measure distances, diameters, areas, angles, and lattice spacings
  • Generate particle size distributions with histograms and basic statistics (mean, median, standard deviation)
  • Annotate and overlay measurement results directly on images
  • Import common image formats (TIFF, PNG, JPEG, BMP) and export data (e.g., CSV) and annotated images

Typical uses include nanoparticle size analysis, grain and pore sizing, nanowire length measurement, and lattice fringe spacing. Its straightforward interface makes it suitable for quick, reproducible measurements without a steep learning curve.

Nano Measurer is developed by Department of Chemitry, Fudan University and is used by 2 users of Software Informer. The most popular version of this product among our users is 1.2. The name of the program executable file is Nano Measurer.exe.

You can check kiki, Lisk Nano, Nano Server Image Builder and other related programs like Tutu iPod Nano Video Converter at the "download" section.

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